Module Testers




  • Fully Automated ATE + Btt Single Step Tester with speeds up to 3Gbps+ data rate!
  • Models available for DIMM or Component Test
  • Capable of handling all standard DDR4 DIMM configurations including LRDIMM
  • Highly advanced system compatibility testing – ensure your DIMMs will work in your client’s systems



  • Fully Automated ATE + Btt Single Step Module Tester with speeds up to 2.133MT/s
  • Test During Burn-In (TDBI) High Temperature Chamber Available
  • Capable of handling all DDR3 and DDR4 DIMM configurations
  • Great for high volume production or engineering lab use



  • Full DDR2 and DDR3 support
  • Easy to use, fully Programmable Pattern Generator (PPG Pro)
  • Address and Data Topology support
  • LRDIMM support
  • Up to 16 DDR2/3 modules tested in parallel Up to 256 devices in parallel
  • Handler interface available



DDR2 memory technology has many new features that have created challenges for memory test engineers. Features like “on die termination” (ODT), differential DQS, higher frequency and lower voltage levels mean that older test equipment may not be sufficient for testing DDR2 devices.



Fully Buffered DIMM technology is fast becoming the Memory of Choice for high speed, high capacity computing applications. With I/O speeds reaching up to 4GHz, the emphasis on providing comprehensive, reliable and accurate testing data becomes increasingly important in the engineering and production success of your memory products. KTI’s FBDIMM KT-2P delivers these needs today.